A Novel Scan Architecture for Low Power Scan-Based Testing
نویسندگان
چکیده
منابع مشابه
Double-Tree Scan: A Novel Low-Power Scan-Path Architecture
states at circuit nodes may erroneously change. Further, BIST schemes with random test patterns may need an excessive amount of energy because of longer test length. Abstract I n a scan-based system with a large number of flip-flops, a major component of power is consumed during scanshift and clocking operation in test mode. In this paper, a novel scan-path architecture called double-tree scan ...
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ژورنال
عنوان ژورنال: VLSI Design
سال: 2015
ISSN: 1065-514X,1563-5171
DOI: 10.1155/2015/264071